JTAG Maps

JTAG Maps

JTAG Maps™ enhances the JTAG testing process by enabling engineers to quickly evaluate boundary-scan net access and prepare test data efficiently. This Altium extension eliminates the tedious task of manual net highlighting, streamlining Design for Test (DfT) workflows and facilitating faster time-to-market with its flexible BSDL model integration and coverage reporting features.

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Top JTAG Maps Features

  • Boundary-scan net mapping
  • Intuitive Altium extension
  • Quick test possibility assessment
  • Automated coverage reporting
  • Supports BSDL model files
  • 'Assume scan covered' option
  • Import/export capability
  • Detailed fault-coverage information
  • Enhanced Design for Test process
  • Time-saving automation
  • Visual highlighting of nets
  • User-friendly interface
  • Seamless integration with Altium
  • Flexible testing configurations
  • Comprehensive analytics support
  • Streamlined JTAG testing workflow
  • Detailed coverage visualization
  • Reduced manual effort
  • Improved time to market.