
OGP Scan-X
Scan-X® offers intuitive surface profiling software that transforms laser scan data into high-resolution two-dimensional and three-dimensional visualizations. Users benefit from adjustable cursors for precise measurements and can analyze imported data offline. The software also features an archive for results and a playback mode, enhancing efficiency in automatic inspections.
Top OGP Scan-X Alternatives
OGP Measure-X
Measure-X® metrology software streamlines part measurement with intuitive click-to-answer questions guiding users through product selection.
TANGRAM
TANGRAM is an intuitive metrology software designed for users seeking a straightforward, cost-effective solution.
OGP Elements
Elements® offers an innovative 2D CAD-based metrology solution tailored for high feature density parts.
ThreeD
ThreeD is a sophisticated metrology software designed for large-volume dimensional measurement.
Verisurf
Verisurf metrology software provides a unified platform for all 3D measuring devices, enabling real-time comparisons between CAD designs and finished parts.
OGP TurnCheck
TurnCheck software streamlines measurement tasks by allowing users to focus on desired outcomes rather than the intricacies of the process.
MiCAT Planner
Operators can customize measurement rules, ensuring adherence to manufacturing requirements...
Metrology.NET
Its innovative module-based "taxonomy" approach enables rapid creation of automated procedures in just three steps...
MeasurLink
It seamlessly integrates with a variety of measuring devices, from calipers to CMMs, allowing for...
OGP VMS
Its parametric programming and scripting features enable customized routines, while Area Multi-Focus generates high-resolution 3D...
MCOSMOS
It enhances CMM efficiency, supports various applications like gear measurement and CAD integration, and allows...
OGP ZONE3
Its intuitive interface effectively illustrates the connections between components, sensors, and datums, enhancing productivity...
Renishaw MODUS
Its user-friendly interface supports simulated probe paths and minimizes CMM downtime...